Semiconductor metrology company Infinitesima Ltd has marked its 25th anniversary with a new corporate brand as it targets growing demand for high-speed, three-dimensional (3D) measurement in semiconductor manufacturing. Founded in 2001 by Professor Andrew Humphris, the company originated as a University of Bristol spin-out to commercialize research conducted during his PhD. Its initial technology addressed the speed limitations of conventional atomic force microscopy (AFM), originally developed to image rapidly changing biological processes. The technology subsequently found applications in semiconductor manufacturing, where faster surface measurement is increasingly important for process control. Infinitesima’s Rapid Probe Microscope (RPM) combines Hybrid Optical-AFM with optical measurement techniques to provide high-speed, three-dimensional surface metrology. The technology is integrated into its Metron3D platform, which is deployed in high-volume semiconductor production. The company identifies advanced packaging, chiplets, high-bandwidth memory and increasingly complex 3D architectures as growth areas for semiconductor metrology. It estimates that its addressable market will exceed $6 billion over the next decade. Infinitesima said its technology is being used in commercial deployments and development activities involving semiconductor industry players including SK hynix, imec and ASML. The company also sees opportunities in hybrid bonding, High-NA EUV lithography and advanced packaging, where increasingly complex structures require more precise surface measurements. Peter Jenkins, president and CEO of Infinitesima, said the new brand reflects the company’s development and its plans to expand its role in semiconductor manufacturing. “Semiconductor manufacturing is entering a period of extraordinary change, driven by AI demand and increasingly complex chip architectures,” Jenkins said. “Our new brand reflects the company we have become and our ambition for the future. We want to give semiconductor manufacturers the accuracy and clarity they need to understand what is happening at the angstrom scale, helping them improve process control, maintain yield and manufacture the next generation of advanced devices.” Jenkins said the company is investing in its applications and manufacturing presence in South Korea and Taiwan, working with local partners to support customers in both markets. Founder and CTO Humphris said the original development effort focused on overcoming the speed limitations of conventional AFM. “When I founded the company 25 years ago, conventional AFM was not fast enough o capture the processes we wanted to understand. That fundamental challenge – of seeing and understanding what was previously impossible – has remained at the heart of what we do,” said Humphris. “We have come a long way from those early days at the University of Bristol, but I genuinely believe the biggest opportunities for Infinitesima are still ahead of us.” The post Infinitesima Marks 25 Years with Focus on 3D Semiconductor Metrology appeared first on EE Times Asia .